发明名称 Verification of 3D integrated circuits
摘要 A method of designing and verifying 3D integrated circuits (3D IC) including providing a first layout corresponding to a first device of a 3D IC. The first layout includes a first interface layer. A second layout corresponding to a second device of the 3D IC is also provided. The second layout includes a second interface layer. A verification of the 3D is performed by verifying the first and second interface layers. The verification includes performing at least one of a design rule check (DRC) or a layout-versus-schematic (LVS) on the first and/or second interface layers.
申请公布号 US8359554(B2) 申请公布日期 2013.01.22
申请号 US201113274091 申请日期 2011.10.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;WANG CHUNG-HSING;TSAI CHIH SHENG;LIU YING-LIN;LIN KAI-YUN 发明人 WANG CHUNG-HSING;TSAI CHIH SHENG;LIU YING-LIN;LIN KAI-YUN
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址