发明名称 Fused buss for plating features on a semiconductor die
摘要 A method for forming a semiconductor structure includes forming a plurality of fuses over a semiconductor substrate; forming a plurality of interconnect layers over the semiconductor substrate and a plurality of interconnect pads at a top surface of the plurality of interconnect layers; and forming a seal ring, wherein the seal ring surrounds active circuitry formed in and on the semiconductor substrate, the plurality of interconnect pads, and the plurality of fuses, wherein each fuse of the plurality of fuses is electrically connected to a corresponding interconnect pad of the plurality of interconnect pads and the seal ring, and wherein when each fuse of the plurality of fuses is in a conductive state, the fuse electrically connects the corresponding interconnect pad to the seal ring.
申请公布号 US8349666(B1) 申请公布日期 2013.01.08
申请号 US201113189054 申请日期 2011.07.22
申请人 FREESCALE SEMICONDUCTOR, INC.;LEAL GEORGE R.;HESS KEVIN J.;UEHLING TRENT S. 发明人 LEAL GEORGE R.;HESS KEVIN J.;UEHLING TRENT S.
分类号 H01L21/82;H01L21/332;H01L21/44;H01L21/4763 主分类号 H01L21/82
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