发明名称 |
INTEGRATED CIRCUIT FOR TESTING USING A HIGH-SPEED INPUT/OUTPUT INTERFACE |
摘要 |
An integrated circuit configured for testing is described. The integrated circuit includes a high-speed input/output interface. The integrated circuit also includes a test controller coupled to the high-speed input/output interface. The integrated circuit further includes test circuitry coupled to the test controller. The test controller controls the test circuitry based on controller protocol test information from the high-speed input/output interface. |
申请公布号 |
US2012324302(A1) |
申请公布日期 |
2012.12.20 |
申请号 |
US201213426235 |
申请日期 |
2012.03.21 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
ARSLAN BARIS;LAISNE MICHAEL;WILEY GEORGE ALAN;SHIPPEE GEOFFREY D. |
分类号 |
G01R31/3177;G06F11/25 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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