| 摘要 |
<p>Provided is a method for measuring the characteristics of an electronic component that can improve the utilization ratio of a measurement device. The characteristics of an electronic component on which an IC is mounted are measured using a single measurement device. Performed in sequence are (a) first processes (60a, 60b) for starting and setting the electronic component in a measurable state, (b) second processes (62a, 62b) for measuring the characteristics of the electronic component in the measurable state, and (c) third processes (64a, 64b) for stopping the started electronic component after data has been written to the electronic component on the basis of the measurement results obtained by the second processes (62a, 62b). During the characteristics measurement step for performing the second processes (62a, 62b), the first processes (60a, 60b) are performed for an electronic component that is to thereafter undergo the second processes (62a, 62b).</p> |
