发明名称 METHOD FOR SETTING FREQUENCY SPAN, AND TEST MEASUREMENT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To automatically set a frequency span of a spectrum analyzer. <P>SOLUTION: Starting with a high reference level, a power level can be automatically measured for each band of a spectrum analyzer. If a suitable minimum power is not found in one of a plurality of bands, the reference level can be decreased automatically, iteratively and gradually until the suitable minimum power is found, or until the most sensitive power level is reached. When power on any band is greater than a predefined noise criteria, a band having the highest power level can be selected, and the center frequency and span for the band measuring the highest power level can be automatically set. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012233895(A) 申请公布日期 2012.11.29
申请号 JP20120103225 申请日期 2012.04.27
申请人 TEKTRONIX INC 发明人 DAVID L SURYAN
分类号 G01R23/173 主分类号 G01R23/173
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