发明名称 |
Surface analysis and measurement method based on flow resistance of fluid and atomic force microscope using the method |
摘要 |
Provided is a surface analysis and measurement method based on the flow resistance of a fluid. The method comprises: spraying a fluid on the surface of a sample; identifying and determining if a flow resistance value of the fluid colliding with the sample surface is optimal for the measurement of the surface topography of the sample; setting the determined optimal flow resistance value to a reference value and moving the sample in the X-Y axes to allow the entire surface of the sample to be scanned; varying the position of the sample in the Z axis together with the X-Y axis movement to adjust varying flow resistance values of the fluid along the irregular surface topography of the sample to the set flow resistance value during scanning; and expressing the movement ranges of the sample in the X, Y and Z axes as numerical values and representing the numerical values as brightness values on a computer screen to display the surface topography of the sample. Further provided is an atomic force microscope using the method. |
申请公布号 |
US8316693(B2) |
申请公布日期 |
2012.11.27 |
申请号 |
US20090625998 |
申请日期 |
2009.11.25 |
申请人 |
KIM SUNG JIN;KIM TAE YOUNG;KIM DONG KWON;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM SUNG JIN;KIM TAE YOUNG;KIM DONG KWON |
分类号 |
G01B13/16 |
主分类号 |
G01B13/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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