| 摘要 |
A zeolite X having (a) a Si/Al framework mole ratio in a range from 1.0 to 1.5; (b) a mean diameter not greater than 2.7 microns; and (c) a relative LTA intensity not greater than 0.35, as determined by x-ray diffraction (XRD). The relative LTA intensity is calculated as 100 times the quotient of a sample LTA XRD intensity divided by a reference XRD intensity of an LTA-type zeolite material. The intensities are summed for each LTA peak with Miller indices of (2 0 0), (4 2 0), and (6 2 2) at 7.27±0.16°, 16.29±0.34° and 24.27±0.50° 2&thetas;. |
