发明名称 Microscope with heightened resolution and linear scanning
摘要 Microscope with heightened resolution and linear scanning wherein the sample is illuminated with a first and a second illuminating light, whereby the first illuminating light excites the sample, and the second illuminating light is generated through the refraction of coherent light at a periodic structure and displays a periodic structure in a lateral beam direction and in axial beam direction.
申请公布号 USRE43702(E1) 申请公布日期 2012.10.02
申请号 US20100973130 申请日期 2010.12.20
申请人 WOLLESCHENSKY RALF;CARL ZEISS MICROIMAGING GMBH 发明人 WOLLESCHENSKY RALF
分类号 G02B21/00;G01N21/64;G02B21/24 主分类号 G02B21/00
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