发明名称 |
Microscope with heightened resolution and linear scanning |
摘要 |
Microscope with heightened resolution and linear scanning wherein the sample is illuminated with a first and a second illuminating light, whereby the first illuminating light excites the sample, and the second illuminating light is generated through the refraction of coherent light at a periodic structure and displays a periodic structure in a lateral beam direction and in axial beam direction. |
申请公布号 |
USRE43702(E1) |
申请公布日期 |
2012.10.02 |
申请号 |
US20100973130 |
申请日期 |
2010.12.20 |
申请人 |
WOLLESCHENSKY RALF;CARL ZEISS MICROIMAGING GMBH |
发明人 |
WOLLESCHENSKY RALF |
分类号 |
G02B21/00;G01N21/64;G02B21/24 |
主分类号 |
G02B21/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|