发明名称 |
SYSTEM AND METHOD FOR DEBUGGING SCAN CHAINS |
摘要 |
Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain. |
申请公布号 |
US2012246531(A1) |
申请公布日期 |
2012.09.27 |
申请号 |
US201113071512 |
申请日期 |
2011.03.25 |
申请人 |
JAIN SANDEEP;KRISHNAMOORTHY NIKILA;CHAUDHARY ABHISHEK;MAHAJAN NIPUN;CHAUHAN SAURABH;FREESCALE SEMICONDUCTOR, INC |
发明人 |
JAIN SANDEEP;KRISHNAMOORTHY NIKILA;CHAUDHARY ABHISHEK;MAHAJAN NIPUN;CHAUHAN SAURABH |
分类号 |
G01R31/28;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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