发明名称 TWO-STAGE OZONE CURE FOR DIELECTRIC FILMS
摘要 A method of forming a silicon oxide layer is described. The method increases the oxygen content of a dielectric layer by curing the layer in a two-step ozone cure. The first step involves exposing the dielectric layer to ozone while the second step involves exposing the dielectric layer to ozone excited by a local plasma. This sequence can reduce or eliminate the need for a subsequent anneal following the cure step. The two-step ozone cures may be applied to silicon-and-nitrogen-containing film to convert the films to silicon oxide.
申请公布号 US2012238108(A1) 申请公布日期 2012.09.20
申请号 US201113227161 申请日期 2011.09.07
申请人 CHEN XIAOLIN;LIANG JINGMEI;INGLE NITIN K.;VENKATARAMAN SHANKAR;APPLIED MATERIALS, INC. 发明人 CHEN XIAOLIN;LIANG JINGMEI;INGLE NITIN K.;VENKATARAMAN SHANKAR
分类号 H01L21/316 主分类号 H01L21/316
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