发明名称 Method for removing electricity and method for manufacturing semiconductor device
摘要 An object is to suppress a significant change in electrical characteristics of thin film transistors and a deviation thereof from the designed range due to static electricity, and to improve the yield in manufacturing semiconductor devices. In order to prevent a substrate from being charged with static electricity by heat treatment or to favorably reduce static electricity with which a substrate is charged in a manufacturing process of a semiconductor device, heat treatment is performed with a substrate provided with a thin film transistor stored in a conductive container. In addition, a heating apparatus for performing the heat treatment is electrically connected to a ground potential, and the container and the substrate are also electrically connected to the ground potential.
申请公布号 US8268642(B2) 申请公布日期 2012.09.18
申请号 US20100893541 申请日期 2010.09.29
申请人 YOSHITOMI SHUHEI;TSUBUKU MASASHI;YAMAZAKI SHUNPEI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YOSHITOMI SHUHEI;TSUBUKU MASASHI;YAMAZAKI SHUNPEI
分类号 H01L21/00;H01L21/31;H01L21/469;H01L21/66;H01L51/40 主分类号 H01L21/00
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