| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nondestructive component analysis device capable of conducting a nondestructive component analysis inside a material without using an accelerator. <P>SOLUTION: The present invention comprises: entrance detection means 1 and stop detection means 2 which respectively detect that a cosmic ray mu particle M enters and then stops; and X-ray energy measuring means 3 which measures energy of characteristic X-ray. The entrance detection means 1 and the stop detection means 2 respectively detect that the cosmic ray mu particle M enters a sample S and then stops therein. The X-ray energy measuring means 3 measures the energy of the characteristic X-ray emitted from an inside of the sample S. Thus, the invention can conduct a nondestructive component analysis using the cosmic ray mu particle without using an accelerator. <P>COPYRIGHT: (C)2012,JPO&INPIT |
