发明名称 METHOD OF DETECTING OR QUANTITATING ENDOGENOUS WHEAT DNA AND METHOD OF DETERMINING CONTAMINATION RATE OF GENETICALLY MODIFIED WHEAT IN TEST SAMPLE
摘要 An object of the present invention is to discover an endogenous wheat sequence satisfying the conditions of: a) it is universally present in varieties of wheat, b) the amount present (detected amount) is not affected depending on the wheat variety, c) even if other grains are present, only wheat can be detected without cross-reactivity, and d) it is amplified quantitatively by the PCR reaction. A further object of the present invention is to provide a method of accurately detecting and quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction. The present invention provides a kit for detecting or quantitating an endogenous wheat DNA sequence in a test sample by the polymerase chain reaction, the kit comprising at least one primer pair capable of amplifying the endogenous wheat DNA sequence.
申请公布号 US2012214161(A1) 申请公布日期 2012.08.23
申请号 US201213366062 申请日期 2012.02.03
申请人 IMAI SHINJIRO;TANAKA KEIKO;NISSHIN SEIFUN GROUP INC. 发明人 IMAI SHINJIRO;TANAKA KEIKO
分类号 C12Q1/68 主分类号 C12Q1/68
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