发明名称 TRENCH MOSFET WITH ULTRA HIGH CELL DENSITY AND MANUFACTURE THEREOF
摘要 A trench MOSFET structure with ultra high cell density is disclosed, wherein the source regions and the body regions are located in different regions to save the mesa area between every two adjacent gate trenches in the active area. Furthermore, the inventive trench MOSFET is composed of stripe cells to further increase cell packing density and decrease on resistance Rds between the drain region and the source region.
申请公布号 US2012196416(A1) 申请公布日期 2012.08.02
申请号 US201213441967 申请日期 2012.04.09
申请人 FORCE MOS TECHNOLOGY CO., LTD. 发明人 HSIEH FU-YUAN
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址