发明名称 Producing germanium layer on lattice mismatched substrate, useful for producing integrated semiconductor components, comprises depositing germanium on substrate, etching back, and depositing further germanium
摘要 <p>Producing germanium layer on a lattice mismatched substrate (10) in a reactor, comprises: (a) depositing germanium on the substrate for producing a preliminary germanium layer (12) with a first layer thickness; (b) etching back a fraction of the first layer thickness of the preliminary germanium layer; and (c) further depositing germanium on the preliminary germanium layer remaining after etching back, until a required layer thickness of the germanium layer to be produced is obtained. An independent claim is also included for producing integrated semiconductor component exhibiting a germanium layer, comprising the above method.</p>
申请公布号 DE102011003409(A1) 申请公布日期 2012.08.02
申请号 DE20111003409 申请日期 2011.01.31
申请人 IHP GMBH - INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS / LEIBNIZ-INSTITUT FUER INNOVATIVE MIKROELEKTRONIK 发明人
分类号 C30B25/18;C30B29/08;H01L21/205;H01L21/3065 主分类号 C30B25/18
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