发明名称 |
Producing germanium layer on lattice mismatched substrate, useful for producing integrated semiconductor components, comprises depositing germanium on substrate, etching back, and depositing further germanium |
摘要 |
<p>Producing germanium layer on a lattice mismatched substrate (10) in a reactor, comprises: (a) depositing germanium on the substrate for producing a preliminary germanium layer (12) with a first layer thickness; (b) etching back a fraction of the first layer thickness of the preliminary germanium layer; and (c) further depositing germanium on the preliminary germanium layer remaining after etching back, until a required layer thickness of the germanium layer to be produced is obtained. An independent claim is also included for producing integrated semiconductor component exhibiting a germanium layer, comprising the above method.</p> |
申请公布号 |
DE102011003409(A1) |
申请公布日期 |
2012.08.02 |
申请号 |
DE20111003409 |
申请日期 |
2011.01.31 |
申请人 |
IHP GMBH - INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS / LEIBNIZ-INSTITUT FUER INNOVATIVE MIKROELEKTRONIK |
发明人 |
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分类号 |
C30B25/18;C30B29/08;H01L21/205;H01L21/3065 |
主分类号 |
C30B25/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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