| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a three-dimensional measuring device and method for correctly calculating an intersection interval to accurately perform three-dimensional measurement. <P>SOLUTION: In a three-dimensional measuring device having: projection means for projecting first pattern light in which bright parts and dark parts are alternately arranged, and second pattern light obtained by shifting a phase of the first pattern light on a measuring object; and imaging means for imaging the measuring object on which the first or second pattern light is projected, an intersection position of a - gradation value is calculated from a gradation value of image data of the first and second pattern light obtained by the imaging means to calculate a three-dimensional position. Here, when a period of repetition of the bright parts and the dark parts of the pattern light is considered as one period, a range within which one pixel which the imaging means has performs imaging on the surface of the measuring object as an imaging interval, and length of one period on the surface of the measuring object of the projected pattern light as M times of the imaging interval, the projection means and the imaging means are arranged so that '2×N-0.2≤M≤2×N+0.2 (provided that N is an integer of 2 or more)'. <P>COPYRIGHT: (C)2012,JPO&INPIT |
