发明名称 SAMPLING APPARATUS AND TEST APPARATUS
摘要 A sampling apparatus that converts an analog target signal in which the same waveform repeats into a digital value by sampling the target signal at each of a plurality of phases, and outputs the digital value. The sampling apparatus comprises a designating section that sequentially designates bits in the digital value as target bits, beginning with the most significant bits; a generating section that, for each designated target bit, generates a threshold value for determining a value of the target bit based on a determined value of a bit that is higher-order than the target bit in the digital value at each of the phases; and a converting section that, for each designated target bit, determines the value of the target bit in the digital value at each phase by comparing the target signal to an analog comparison signal corresponding to the threshold value at each phase.
申请公布号 US2012176143(A1) 申请公布日期 2012.07.12
申请号 US201113177563 申请日期 2011.07.07
申请人 KAWABATA MASAYUKI;KURAMOCHI YASUHIDE;ADVANTEST CORPORATION 发明人 KAWABATA MASAYUKI;KURAMOCHI YASUHIDE
分类号 G01R31/00;H03M1/12 主分类号 G01R31/00
代理机构 代理人
主权项
地址