发明名称 METHODS AND STRUCTURES FOR INCREASED THERMAL DISSIPATION OF THIN FILM RESISTORS
摘要 A method of forming a semiconductor structure includes forming at least one trench in an insulator layer formed on a substrate. A distance between a bottom edge of the at least one trench and a top surface of a substrate is shorter than a distance between an uppermost surface of the insulator layer and the top surface of the substrate. The method also includes: forming a resistor on the insulator layer and extending into the at least one trench; forming a first contact in contact with the resistor; and forming a second contact in contact with the resistor such that current is configured to flow from the first contact to the second contact through a central portion of the resistor.
申请公布号 US2012146187(A1) 申请公布日期 2012.06.14
申请号 US20100968001 申请日期 2010.12.14
申请人 ANDERSON BRENT A.;RANKIN JED H.;ROBISON ROBERT R.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDERSON BRENT A.;RANKIN JED H.;ROBISON ROBERT R.
分类号 H01L29/86;H01L21/02 主分类号 H01L29/86
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