发明名称 Spectral reflectance measurement system of geological rock samples in dark room
摘要 PURPOSE: A system for measuring a spectral reflectance of a rock sample is provided to perform a measurement by controlling an incident angle of an artificial light source under a circumstance similar to an imaging photographing time zone. CONSTITUTION: A system for measuring a spectral reflectance of a rock sample comprises a spectral measuring part(1), a holder part(2), an light source part(3), and a controller(4). The spectral measuring part measure a spectral reflectance of a rock sample by using information input by a spectral sensor and the spectral sensor. The holder part is composed of a holder(21) and controlling member(22). The controlling member arranged in the lower part of the holder adjusts a distance between the rock sample and the spectral sensor. The holder part fixes the rock sample to be positioned on the center of the spectral sensor and maintains the balanced state of the rock sample. The light source part comprises a lamp(31), an incident angle controlling unit(32), an arm unit(33), and a stand(34). The controller is composed of a PC(41) and automatic voltage controller(42).
申请公布号 KR20120057936(A) 申请公布日期 2012.06.07
申请号 KR20100119504 申请日期 2010.11.29
申请人 KOREA INSTITUTE OF GEOSCIENCE AND MINERAL RESOURCES(KIGAM) 发明人 LEE, HONG JIN
分类号 G01J3/02 主分类号 G01J3/02
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