| 摘要 |
Provided are a striped pattern image examination support device, method, and program. The device includes: image transformation element for transforming at least one of two striped pattern images so as to cause coordinates of charting points, which are points that correspond across the two striped pattern images, to match in a plurality of pairs of the charting points which are included in the two striped pattern images; intersecting point extraction element for calculating coordinates of intersecting points of stripes in the striped pattern images and line segments each of which connects two of the charting points in the striped pattern images; charting diagram display element for displaying the two striped pattern images after transformation by the image transformation element, and displaying figures representing charting points at positions corresponding to coordinates after the transformations of each of the charting points on the two striped pattern images.
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