| 摘要 |
<p>The invention relates to a test device to test the robustness of electronic circuits or devices (DUT) towards electrical overstresses (Electrical Overstresses, EOS), comprising an electronic test board (12), an adapter circuit (14, 15) to which the DUT can be mounted acting as an interface between the DUT and the electronic test board so as to supply the DUT at least one electrical power supply signal and stimulation signals suitable to simulate the functioning of the DUT in different conditions of use. The electronic test board comprises at least one first EOS generator circuit (18) applicable to at least one electrical power supply signal of the DUT, a second EOS generator circuit (20) applicable to said stimulation signals, and a selection circuit (22) suitable to alternatively or contemporaneously operate said EOS generator circuits.</p> |
