发明名称 |
METAL-DOPED OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR |
摘要 |
<p>PURPOSE: A metal doped oxide semiconductor thin film transistor is provided to easily control device properties according to a process condition by suppressing carrier generation due to oxygen deficiency. CONSTITUTION: A gate electrode(12) is formed on a substrate(10). A gate insulating film(14) is formed on the upper part of the substrate. An oxide semiconductor layer(16) is formed on the gate insulating film. The oxide semiconductor layer provides a channel region, a source region, and a drain region. Source and drain electrodes(18a,18b) are respectively formed on the oxide semiconductor layer.</p> |
申请公布号 |
KR20120050565(A) |
申请公布日期 |
2012.05.21 |
申请号 |
KR20100111875 |
申请日期 |
2010.11.11 |
申请人 |
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
PARK, JONG WAN;KIM, WOONG SUN;KIM, KYUNG TAEK;MOON, YEON KEON;SHIN, SAE YOUNG |
分类号 |
H01L29/786;G02F1/136 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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