发明名称 METAL-DOPED OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR
摘要 <p>PURPOSE: A metal doped oxide semiconductor thin film transistor is provided to easily control device properties according to a process condition by suppressing carrier generation due to oxygen deficiency. CONSTITUTION: A gate electrode(12) is formed on a substrate(10). A gate insulating film(14) is formed on the upper part of the substrate. An oxide semiconductor layer(16) is formed on the gate insulating film. The oxide semiconductor layer provides a channel region, a source region, and a drain region. Source and drain electrodes(18a,18b) are respectively formed on the oxide semiconductor layer.</p>
申请公布号 KR20120050565(A) 申请公布日期 2012.05.21
申请号 KR20100111875 申请日期 2010.11.11
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 PARK, JONG WAN;KIM, WOONG SUN;KIM, KYUNG TAEK;MOON, YEON KEON;SHIN, SAE YOUNG
分类号 H01L29/786;G02F1/136 主分类号 H01L29/786
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