发明名称 |
ELECTROMECHANICAL SYSTEMS APPARATUSES AND METHODS FOR PROVIDING ROUGH SURFACES |
摘要 |
<p>This disclosure provides systems, methods, and apparatus for producing roughness in an electromechanical device by nucleation under plasma CVD conditions. In one aspect, a substrate and at least a first layer are provided. The disclosure further provides gas phase nucleating particles under plasma CVD conditions and depositing a first layer, where the particles are incorporated into the first layer to create roughness in the first layer. The roughness may be transferred to a second layer by conformal deposition of the second layer over the first layer. The roughness of the second layer corresponds to the roughness of the first layer, where the first layer has a roughness greater than or equal to about 20 Å root mean square (RMS).</p> |
申请公布号 |
WO2012061205(A1) |
申请公布日期 |
2012.05.10 |
申请号 |
WO2011US58145 |
申请日期 |
2011.10.27 |
申请人 |
QUALCOMM MEMS TECHNOLOGIES, INC.;SASAGAWA, TERUO;FENNELL, LEONARD, EUGENE |
发明人 |
SASAGAWA, TERUO;FENNELL, LEONARD, EUGENE |
分类号 |
H01H59/00;B81B3/00;H01L21/768 |
主分类号 |
H01H59/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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