发明名称 METAL SCALE ANALYSIS APPARATUS AND ITS METHOD
摘要 PURPOSE: A metal scale measure system and a method thereof, which can measure the junction property and the scale of a scale on a metal. CONSTITUTION: A metal scale measure system comprises a measuring part(10) and a scale analysis part(30). The measuring part transmits super high frequency through an antenna. The measuring part measures the reflected wave reflected to the scale layer through the other antenna. The scale analysis part analyzes the distribution of the scale layer. The measuring part comprises a transmission antenna, a modulator, a mixer part, and an amplifier.
申请公布号 KR101138282(B1) 申请公布日期 2012.04.26
申请号 KR20090084309 申请日期 2009.09.08
申请人 发明人
分类号 G01B15/02;G01B15/00;G01B21/08 主分类号 G01B15/02
代理机构 代理人
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