发明名称 Semiconductor device and test method thereof
摘要 plurality of core chips to which chip identification information different from each other is allocated and an interface chip are layered, the plurality of core chips are commonly connected to the interface chip through a first current path including at least a through silicon via, the interface chip serially supplies an enable signal to the plurality of core chips through the first current path, and the plurality of core chips are activated based on a logic level of a bit corresponding to the chip identification information among a plurality of bits configuring the enable signal. The present invention can reduce the number of through silicon vias required to supply an enable signal.
申请公布号 US2012092943(A1) 申请公布日期 2012.04.19
申请号 US201113137969 申请日期 2011.09.22
申请人 ELPIDA MEMORY, INC. 发明人 NISHIOKA NAOHISA
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
主权项
地址