发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device having a fine contact hole with a good shape. <P>SOLUTION: A method of manufacturing a semiconductor device includes the following steps of: forming a photoresist film 42 on an insulating film 36; forming an opening 44 to the photoresist film 42; and etching the insulating film 36 using the photoresist film 42 to which the opening 44 is formed as a mask to form a contact hole 48. The step of forming a contact hole 48 includes: a first step of performing plasma etching of the insulating film 36 while depositing a protection film 46 on the photoresist film 42 to which the opening 44 is formed; a second step of removing the protection film 46 deposited on the photoresist film 42 once; and a third step of further performing plasma etching of the insulating film 36 while newly depositing another protection film on the photoresist film 42 from which the protection film 46 is removed once. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012079792(A) 申请公布日期 2012.04.19
申请号 JP20100221361 申请日期 2010.09.30
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 OSHIRYOJI MICHIO
分类号 H01L21/3065;H01L21/768 主分类号 H01L21/3065
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