发明名称 Method and system for evaluating a variation in a parameter of a pattern
摘要 A method and system are presented for evaluating a variation of a parameter of a pattern. The method includes processing data indicative of an aerial intensity image of at least a portion of a patterned article, and determining values of a certain functional of the aerial image intensity for predetermined regions within the at least portion of the patterned article. The values of the aerial image intensity functional are indicative of a variation of at least one parameter of the pattern within the at least portion of the patterned article or are indicative of a variation of at least one parameter of a pattern manufactured by utilizing the patterned article.
申请公布号 US8160350(B2) 申请公布日期 2012.04.17
申请号 US20070994412 申请日期 2007.02.01
申请人 YISHAI MICHAEL BEN;WAGNER MARK;BARTOV AVISHAI;GREENBERG GADI;SHOVAL LIOR;GVIRTZER OPHIR;APPLIED MATERIALS ISRAEL, LTD. 发明人 YISHAI MICHAEL BEN;WAGNER MARK;BARTOV AVISHAI;GREENBERG GADI;SHOVAL LIOR;GVIRTZER OPHIR
分类号 G06K9/00 主分类号 G06K9/00
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