发明名称 MANUFACTURING APPARATUS FOR RESISTANCE MEMORY DEVICE
摘要 <p>PURPOSE: A resistive memory device manufacturing apparatus is provided to manufacture oxide layers in different chambers with respect to the composition of each oxide layer, thereby preventing contamination generated by manufacturing the oxide layers in a single chamber. CONSTITUTION: A load-lock chamber(210) receives a substrate from the outside. A movable module chamber(220) comprises a robot arm which transfers the substrate from the load-lock chamber. A first oxide deposition chamber(240) is used for depositing a first buffer layer and a second buffer layer. A second oxide deposition chamber(250) is used for depositing a resistive change layer. A metal electrode deposition chamber(230) is used for depositing a first electrode and a second electrode.</p>
申请公布号 KR20120032909(A) 申请公布日期 2012.04.06
申请号 KR20100094468 申请日期 2010.09.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHANG, MAN;KIM, CHANG JUNG;KIM, YOUNG BAE;LEE, MYOUNG JAE;HUR, JI HYUN;LEE, DONG SOO;LEE, CHANG BUM;LEE, SEUNG RYUL
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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