发明名称 |
Test apparatus of semiconductor integrated circuit and method using the same |
摘要 |
A test apparatus includes a test fuse unit for generating a test fuse signal in response to a test mode signal during a test time and generating a test fuse signals according to a fuse cutting after a termination of the test time, a combination signal generating unit for storing a test signal and inactivating a combination signal when the test mode signal is inactivate and for outputting the stored test signal as the combination signal when the test mode signal is activate, and a code signal generating unit for activating a test code signal when one of the test fuse signal and the combination signal is activated. |
申请公布号 |
US8149639(B2) |
申请公布日期 |
2012.04.03 |
申请号 |
US20100941874 |
申请日期 |
2010.11.08 |
申请人 |
KIM JONG-SAM;CHO KWANG-JUN;HYNIX SEMICONDUCTOR, INC. |
发明人 |
KIM JONG-SAM;CHO KWANG-JUN |
分类号 |
G11C29/00;G11C7/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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