METHOD OF SLIMMING RADIATION-SENSITIVE MATERIAL LINES IN LITHOGRAPHIC APPLICATIONS
摘要
A method and system for patterning a substrate using a radiation-sensitive material is described. The method (500) and system include forming a layer of radiation-sensitive material on a substrate (510), exposing the layer of radiation- sensitive material to a pattern of radiation (520), and then performing a post-exposure bake following the exposing (530). The imaged layer of radiation-sensitive material is then positive-tone developed to remove a region having high radiation exposure to form radiation-sensitive material lines (540). An exposure gradient within the radiation-sensitive material lines is then removed (550), followed by slimming the radiation-sensitive material lines (560).
申请公布号
WO2011123433(A3)
申请公布日期
2012.03.29
申请号
WO2011US30299
申请日期
2011.03.29
申请人
TOKYO ELECTRON LIMITED;TOKYO ELECTRON AMERICA, INC.;CARCASI, MICHAEL, A.;RATHSACK, BENJAMIN, M.;SOMERVELL, MARK, H.
发明人
CARCASI, MICHAEL, A.;RATHSACK, BENJAMIN, M.;SOMERVELL, MARK, H.