发明名称 LASER SURVEY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a laser survey device for easily specifying the factor of operation abnormality. <P>SOLUTION: The laser survey device includes: a leveling part 3; a light source part 14 for emitting a laser beam; a projection optical system for emitting the laser beam; a power source part; a control unit 7 for controlling driving; a storage unit 26; inclination detection means 11 for detecting a leveling state; rotational frequency detection means 13 for detecting the rotational frequency of a motor; light source detection means 16a and 16b for detecting the emission state of the light source part; voltage detection means 24 for detecting the voltage of the power source part; and abnormality detection means 25 for detecting operation abnormality. The control unit monitors the presence/absence of abnormality by the abnormality detection means, and time-sequentially stores the detection signal from each detection means as sampling data with prescribed time intervals in the storage unit. When the quantity of the sampling data exceeds prescribed quantity, the sampling data are deleted in the order of old one, and successively overwritten with new sampling data, and when at least one of the detection signals to be monitored shows abnormality, the sampling data in a range of a prescribed time with a point of time when the abnormality is shown as a base point are stored as data for abnormality factor analysis. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012063167(A) 申请公布日期 2012.03.29
申请号 JP20100205857 申请日期 2010.09.14
申请人 TOPCON CORP 发明人 KUMAGAI KAORU;FURUHIRA JUNICHI
分类号 G01C15/00 主分类号 G01C15/00
代理机构 代理人
主权项
地址