发明名称 INSTALLATION ENVIRONMENT INVESTIGATION DEVICE AND INSTALLATION ENVIRONMENT INVESTIGATION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an installation environment investigation device and an installation environment investigation system that automatically and suitably re-set a threshold used to measure information in an abnormal state in which a signal generated in single short or with unpredictable timing in the installation environment of a device to be investigated is measured. <P>SOLUTION: The installation environment investigation device including an input part which is arranged at a measurement place in a periphery of the device to be investigated and to which electric physical quantities at the measurement place are input one after another, and a determination part which determines whether a measured value corresponding to an electric physical quantity input to the input part exceeds a threshold determining an upper-limit value or lower-limit value of a measurement range is configured to re-set the measured value to the threshold when there is an abnormality occurrence signal input from the device to be investigated and the measured value does not exceed the threshold or when there is no abnormality occurrence signal and the measured value exceeds the threshold. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012058205(A) 申请公布日期 2012.03.22
申请号 JP20100204709 申请日期 2010.09.13
申请人 TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEM CORP 发明人 MAEHATA NORIYUKI;MATSUDA SHIGEHIKO
分类号 G01D1/18 主分类号 G01D1/18
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