发明名称 METHOD FOR DESIGNING SAMPLING TEST
摘要 <P>PROBLEM TO BE SOLVED: To easily and accurately design a sampling test even in the case that an assumption about skip lot sampling is not true. <P>SOLUTION: A skip frequency showing a frequency with which a testing process is skipped and a skip condition that, if at least q pieces (q is an integer equal to or larger than 2 and equal to or smaller than i) of lots out of i pieces (i is an integer equal to or larger than 2) of lots consecutive immediately before a non-tested lot determined on the basis of the skip frequency are rejected, a lot which should skip the testing process next is changed to a lot to be tested are accepted, and a first pass rate on the assumption that the testing process is executed using the skip condition is calculated, and a test ratio being a proportion of the number of tested lots to the total number of lots on the assumption that the testing process is executed by using the skip frequency and the skip condition is calculated, and the skip frequency is determined as a sampling plan if delay does not occur in a manufacturing line, but the skip frequency is changed and then is determined as a sampling plan if delay occurs in the manufacturing line. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012058816(A) 申请公布日期 2012.03.22
申请号 JP20100198768 申请日期 2010.09.06
申请人 TOSHIBA CORP 发明人 IKEDA TAKAHIRO;KASA KENTARO
分类号 G05B19/418;G01R31/28;G06Q50/04;H01L21/02;H01L21/66 主分类号 G05B19/418
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