首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD FOR MEASURING ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR SUBSTRATE
摘要
申请公布号
KR20120027124(A)
申请公布日期
2012.03.21
申请号
KR20117022230
申请日期
2010.04.13
申请人
SUMITOMO CHEMICAL CO., LTD.
发明人
FUKUHARA NOBORU;HATA MASAHIKO
分类号
H01L21/66;G01N27/00
主分类号
H01L21/66
代理机构
代理人
主权项
地址
您可能感兴趣的专利
WIND ENERGY SYSTEM AND METHOD FOR USING SAME
ALL-SOLID-STATE BATTERY, AND PRODUCTION METHOD THEREFOR
BIOREFINERY SYSTEM, METHODS AND COMPOSITIONS THEREOF
RINSING ARRANGEMENT FOR A DOMESTIC APPLIANCE FOR THE CARE OF LAUNDRY ITEMS, AND DOMESTIC APPLIANCE FOR THE CARE OF LAUNDRY ITEMS
LIQUID RING SCREW PUMP DESIGN
CURRENT COLLECTOR, ELECTRODE, SECONDARY CELL, AND CAPACITOR
MICROMIRROR ARRAY, MANUFACTURING METHOD FOR MICROMIRROR ARRAY, AND OPTICAL ELEMENTS USED IN MICROMIRROR ARRAY
CURRENT COLLECTOR FOIL, ELECTRODE STRUCTURE, LITHIUM SECONDARY CELL, OR ELECTRIC DOUBLE-LAYER CAPACITOR
GAME MACHINE
GAME MACHINE
DISPERSED STORAGE NETWORK VIRTUAL ADDRESS SPACE
Baking Pan Assembly
APPARATUS, METHOD AND ARTICLE FOR PROVIDING LOCATIONS OF POWER STORAGE DEVICE COLLECTION, CHARGING AND DISTRIBUTION MACHINES
DATA INTERFACE CLOCK GENERATION
LAMINA IMPLANT AND METHOD
APPARATUS AND METHOD FOR COOLING CONTAINERS
FREE FLOATING PADDLE ACTUATION SYSTEM
BACTERIOPHAGE AND ANTIBACTERIAL COMPOSITION COMPRISING THE SAME
SYSTEM AND METHOD FOR ULTRASOUND SCATTERER CHARACTERIZATION
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING PROGRAM
