发明名称 DISPLACEMENT MEASURING METHOD AND DEVICE THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem that since a probe optical path is separated spatially from a reference optical path, when temperature distribution, refractive index distribution by fluctuation of air or the like or a mechanical vibration is generated, an optical path difference is fluctuated between both optical paths to generate a measurement error, in a displacement measuring device using optical interference. <P>SOLUTION: An optical axis of probe light and the optical axis of reference light are brought close up to a distance uninfluenced by a disturbance, and an object is irradiated with the probe light and a reference plane is irradiated with the reference light respectively, and each reflected light is allowed to interfere with each other, and displacement of the object is determined from generated interference light. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012053065(A) 申请公布日期 2012.03.15
申请号 JP20110246068 申请日期 2011.11.10
申请人 HITACHI LTD 发明人 NAKADA TOSHIHIKO;WATANABE MASAHIRO;BABA SHUICHI;YOSHITAKE YASUHIRO;NOMOTO MINEO
分类号 G01B9/02;G01B11/00 主分类号 G01B9/02
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