| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique for improving detection accuracy of a modification made to a conductive pattern disposed on a circuit block to be protected. <P>SOLUTION: A semiconductor integrated circuit device comprises: a circuit block disposed on a semiconductor substrate; a conductive pattern disposed on an upper layer of a portion to be protected of the circuit block; a reset unit for resetting an electric potential of a first portion of the conductive pattern to a reference potential; a connection unit for connecting the first portion to a current supply line; and a detection circuit for determining whether a voltage of the first portion is within a predetermined range or not when a fixed time elapses after the first portion is connected to the current supply line after the electric potential of the first portion is reset to the reference potential, and for detecting that a modification is made to the conductive pattern when the voltage after a lapse of the fixed time is not within the predetermined range. A change in the voltage of the first portion depends on a circuit constant of the conductive pattern. <P>COPYRIGHT: (C)2012,JPO&INPIT |
