发明名称 DIFFERENTIAL MEASURING PROBE
摘要 <P>PROBLEM TO BE SOLVED: To provide a differential measuring probe in which, by providing a mechanism for changing a pin pitch through a lever, the pin pitch can be easily changed without touching an angle pin with a hand and when the angle pin is pressed to an object to be measured, the angle pin is suppressed from being unexpectedly rotated with a reaction of pressing. <P>SOLUTION: A differential measuring probe which inputs a signal to be measured from distal ends of a pair of angle pins includes a socket, a socket accommodation part and a lever. The socket is formed approximately columnar, has a groove formed on an outer circumferential surface of the socket itself obliquely to its axis, and has the angle pin inserted into one end of the socket itself. In the socket accommodation part, a pair of sockets is arranged in a mirror image relationship, and each of the sockets is accommodated so as to be rotated around its axis. The lever has a projection to be inserted into the groove of each of the pair of sockets and slides in parallel with the axis of the socket. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012042413(A) 申请公布日期 2012.03.01
申请号 JP20100186019 申请日期 2010.08.23
申请人 YOKOGAWA ELECTRIC CORP 发明人 SATO ISAMU
分类号 G01R1/073 主分类号 G01R1/073
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