发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of easily burying a conductive material into a gate recess. <P>SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: forming an insulating film on a semiconductor substrate, a recess provided on the insulating film, and a gate insulating film provided on the semiconductor substrate that is the bottom of the recess; forming a first gate electrode film with a conductive material including a first metal on the inner surfaces of the recess and on the top surface of the insulating film; forming a cover film having a higher melting point than that of the conductive material on the first gate electrode film so as not to cover a part of the side surfaces of the trench; and reflowing the first gate electrode film by performing heat treatment with the cover film formed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012038821(A) 申请公布日期 2012.02.23
申请号 JP20100175727 申请日期 2010.08.04
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 HANEDA MASAKI
分类号 H01L29/78;H01L21/28;H01L21/336;H01L29/423;H01L29/49 主分类号 H01L29/78
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