发明名称 Apparatus and method for inspecting sample
摘要 Method and apparatus have a film including a first surface to hold the liquid sample thereon, a vacuum chamber for reducing the pressure of an ambient in contact with a second surface of the film, primary beam irradiation means connected with the vacuum chamber and irradiating the sample with a primary beam via the film, signal detection means for detecting a secondary signal produced from the sample in response to the beam irradiation, a partitioning plate for partially partitioning off the space between the film and the primary beam irradiation means in the vacuum chamber, and a vacuum gauge for detecting the pressure inside the vacuum chamber.
申请公布号 US8119994(B2) 申请公布日期 2012.02.21
申请号 US20090407918 申请日期 2009.03.20
申请人 NISHIYAMA HIDETOSHI;KOIZUMI MITSURU;JEOL LTD. 发明人 NISHIYAMA HIDETOSHI;KOIZUMI MITSURU
分类号 H01J37/20 主分类号 H01J37/20
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