发明名称 Method for manufacturing back side illuminaton image sensor
摘要 A method of manufacturing a back side illumination image sensor according to an embodiment includes: forming an ion implantation layer by implanting ions throughout the front side of a first substrate; defining a pixel region by forming a device isolation region on the front side of the first substrate; forming a photosensitive device and a readout circuit on the pixel region; forming an interlayer dielectric layer and a metal line on the front side of the first substrate; bonding a second substrate with the front side of the first substrate where the metal line is formed; removing a lower part of the first substrate under the ion implantation layer; applying wet etching to a back side of the first substrate after removing the lower part; and forming a microlens on the photosensitive device at the back side of the first substrate.
申请公布号 US8114694(B2) 申请公布日期 2012.02.14
申请号 US20090640874 申请日期 2009.12.17
申请人 KIM MUN HWAN;DONGBU HITEK CO., LTD. 发明人 KIM MUN HWAN
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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