发明名称 |
Method for manufacturing back side illuminaton image sensor |
摘要 |
A method of manufacturing a back side illumination image sensor according to an embodiment includes: forming an ion implantation layer by implanting ions throughout the front side of a first substrate; defining a pixel region by forming a device isolation region on the front side of the first substrate; forming a photosensitive device and a readout circuit on the pixel region; forming an interlayer dielectric layer and a metal line on the front side of the first substrate; bonding a second substrate with the front side of the first substrate where the metal line is formed; removing a lower part of the first substrate under the ion implantation layer; applying wet etching to a back side of the first substrate after removing the lower part; and forming a microlens on the photosensitive device at the back side of the first substrate. |
申请公布号 |
US8114694(B2) |
申请公布日期 |
2012.02.14 |
申请号 |
US20090640874 |
申请日期 |
2009.12.17 |
申请人 |
KIM MUN HWAN;DONGBU HITEK CO., LTD. |
发明人 |
KIM MUN HWAN |
分类号 |
H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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