发明名称
摘要 <p><P>PROBLEM TO BE SOLVED: To inexpensively form uniform unevenness on a silicon substrate with good reproducibility even for, as an object, a large area substrate of about 15 cm square or more which is difficult conventionally. <P>SOLUTION: The roughening method of a silicon substrate comprises: a process of applying an organic metal solution or an organic metal dispersion solution on a substrate in a dot shape with an ink jet method; a process of drying the substrate; a process of irradiating the surface of the substrate with plasma; and a process of etching the substrate. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP4869967(B2) 申请公布日期 2012.02.08
申请号 JP20070022706 申请日期 2007.02.01
申请人 发明人
分类号 H01L21/3065;H01L21/306;H01L31/04 主分类号 H01L21/3065
代理机构 代理人
主权项
地址