发明名称 MOLD SHAPE TO OPTIMIZE THICKNESS UNIFORMITY OF SILICON FILM
摘要 A method of making a solid layer of a semiconducting material involves selecting a mold having a leading edge thickness and a different trailing edge thickness such that in respective plots of solid layer thickness versus effective submersion time for submersion of the leading and trailing edges into molten semiconducting material, a thickness of the solid layer adjacent to the leading and trailing edges are substantially equal. The mold is submersed into and withdrawn from the molten semiconducting material to form a solid layer of semiconducting material over an external surface of the mold.
申请公布号 US2012027996(A1) 申请公布日期 2012.02.02
申请号 US20100844305 申请日期 2010.07.27
申请人 COOK GLEN BENNETT;MAZUMDER PRANTIK;SUMAN BALRAM 发明人 COOK GLEN BENNETT;MAZUMDER PRANTIK;SUMAN BALRAM
分类号 B29C41/14 主分类号 B29C41/14
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