发明名称 |
MOLD SHAPE TO OPTIMIZE THICKNESS UNIFORMITY OF SILICON FILM |
摘要 |
A method of making a solid layer of a semiconducting material involves selecting a mold having a leading edge thickness and a different trailing edge thickness such that in respective plots of solid layer thickness versus effective submersion time for submersion of the leading and trailing edges into molten semiconducting material, a thickness of the solid layer adjacent to the leading and trailing edges are substantially equal. The mold is submersed into and withdrawn from the molten semiconducting material to form a solid layer of semiconducting material over an external surface of the mold.
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申请公布号 |
US2012027996(A1) |
申请公布日期 |
2012.02.02 |
申请号 |
US20100844305 |
申请日期 |
2010.07.27 |
申请人 |
COOK GLEN BENNETT;MAZUMDER PRANTIK;SUMAN BALRAM |
发明人 |
COOK GLEN BENNETT;MAZUMDER PRANTIK;SUMAN BALRAM |
分类号 |
B29C41/14 |
主分类号 |
B29C41/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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