发明名称 Detecting device and method for detecting unevenness of a glass substrate
摘要 A detecting device of unevenness of a glass substrate includes a light source emitting a light; a polarizer polarizing the light; a standard cell including opposing outer surfaces, the glass substrate attached to one of the opposing outer surfaces, the polarized light passing through the standard cell and the glass substrate; an analyzer detecting and analyzing the light passing through the standard cell and the glass substrate.
申请公布号 US8107078(B2) 申请公布日期 2012.01.31
申请号 US20080314699 申请日期 2008.12.15
申请人 OH KUM-MI;ZEON YONG-WON;LG DISPLAY CO., LTD. 发明人 OH KUM-MI;ZEON YONG-WON
分类号 G01J4/00;G01N21/00 主分类号 G01J4/00
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