发明名称 METHOD FOR MAKING COMPOUND SEMICONDUCTOR AND METHOD FOR MAKING SEMICONDUCTOR DEVICE
摘要 <p>In a method for making a compound semiconductor including a substrate and a compound semiconductor layer having a lattice mismatch ratio of 2% or more relative to the substrate, the method includes a first epitaxial growth step of forming a buffer layer on the substrate, the buffer layer having a predetermined distribution of lattice mismatch ratios in the thickness direction so as to reduce strain; and a second epitaxial growth step of forming the compound semiconductor layer on the buffer layer. The first epitaxial growth step is carried out by metal organic chemical vapor deposition at a deposition temperature of 600° C. or less.</p>
申请公布号 KR101096331(B1) 申请公布日期 2011.12.20
申请号 KR20050022583 申请日期 2005.03.18
申请人 发明人
分类号 H01L21/20;C30B25/18;C30B29/40;H01L21/205;H01L29/15;H01L31/0312;H01L31/10;H01L31/103;H01L31/18;H01L33/12;H01L33/30;H01L33/34 主分类号 H01L21/20
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