发明名称 POWER SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a power semiconductor device capable of preventing the occurrence of solder cracks under an insulating substrate and warpage of a heat sink by reducing the thickness of the heat sink. <P>SOLUTION: The power semiconductor device comprises an insulating substrate 2 on which a power semiconductor element 1 is mounted, and a heat sink 3 mounting the insulating substrate 2 via solder 5, forming a metal layer. In the heat sink 3, the thickness of a first region mounting the insulating substrate 2 is thinner than that of a second region not mounting the insulating substrate 2, which surrounds the first region. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011253928(A) 申请公布日期 2011.12.15
申请号 JP20100126605 申请日期 2010.06.02
申请人 MITSUBISHI ELECTRIC CORP 发明人 SATO MASAAKI;NISHIBORI HIROSHI;YOSHIHARA KUNIHIRO
分类号 H01L23/36;H01L23/12 主分类号 H01L23/36
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