发明名称 A FAULTY-TESTER OF THE LED CHIP
摘要 PURPOSE: An LED chip junction failure detecting apparatus is provided to determine whether a junction position which is wire-bonded is faulty or not while maintaining the failure detecting condition of an LED package array plate in the high temperature. CONSTITUTION: LED chips are installed in an LED package array plate. A lead of the LED chip package is arranged in the LED package array plate. A probe pin unit(3) is connected to the lead and sanctions electricity. A settlement plate(2) is applied a power source and is heated. The settlement plate heats the LED package array plate. The LED package array plate is settled in the settlement plate. A probe pin of the probe pin unit passes through a guiding hole(4).
申请公布号 KR20110131426(A) 申请公布日期 2011.12.07
申请号 KR20100050865 申请日期 2010.05.31
申请人 CS ENG CO., LTD.;JANG, SUNG MIN;LEE, SOON JOUNG 发明人 LEE, SOON JOUNG;JANG, SUNG MIN
分类号 G01R31/02;H01L33/00 主分类号 G01R31/02
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