发明名称 DETERMINING A QUANTITY OF A GIVEN MATERIAL IN A SUBTERRANEAN STRUCTURE
摘要 A profile is produced based on measured survey data, where the profile contains indications corresponding to refraction events at different depths in a subterranean structure. Based on the profile and a critical angle model that correlates different concentrations of a given material to respective critical angles, a quantity of the given material in a subterranean structure at a particular depth is determined.
申请公布号 WO2011150387(A2) 申请公布日期 2011.12.01
申请号 WO2011US38431 申请日期 2011.05.27
申请人 GECO TECHNOLOGY B.V.;SCHLUMBERGER CANADA LIMITED;DAI, JIANCHUN 发明人 DAI, JIANCHUN
分类号 G01V1/38;G01V1/28;G06F19/00 主分类号 G01V1/38
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