发明名称 |
DETERMINING A QUANTITY OF A GIVEN MATERIAL IN A SUBTERRANEAN STRUCTURE |
摘要 |
A profile is produced based on measured survey data, where the profile contains indications corresponding to refraction events at different depths in a subterranean structure. Based on the profile and a critical angle model that correlates different concentrations of a given material to respective critical angles, a quantity of the given material in a subterranean structure at a particular depth is determined. |
申请公布号 |
WO2011150387(A2) |
申请公布日期 |
2011.12.01 |
申请号 |
WO2011US38431 |
申请日期 |
2011.05.27 |
申请人 |
GECO TECHNOLOGY B.V.;SCHLUMBERGER CANADA LIMITED;DAI, JIANCHUN |
发明人 |
DAI, JIANCHUN |
分类号 |
G01V1/38;G01V1/28;G06F19/00 |
主分类号 |
G01V1/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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