| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce an assembly cost by making chips defective before assembly instead of making them defective in a stress test after assembly. <P>SOLUTION: A semiconductor storage device includes: a precharge MOS for precharging an I/O line pair, a light amplifier for writing light data into the I/O line pair, and a light data write control circuit which receives an external input signal, and which activates or inactivates the I/O line pair according to whether the external input signal is active or not by controlling the precharge MOS and the light amplifier. <P>COPYRIGHT: (C)2012,JPO&INPIT |
