发明名称 RESONANCE COMPENSATION IN SCANNING PROBE MICROSCOPY
摘要 A method includes generating, using a sensor, a data signal. The data signal includes a first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction substantially in the plane of the sample; and a second component based on at least one of topographic variations of the sample in a second direction, and a materials property of the sample. The method further includes generating, using a processor, a compensatory signal based on the first component of the data signal generated by the sensor; and providing the compensatory signal to the actuator.
申请公布号 US2011289635(A1) 申请公布日期 2011.11.24
申请号 US20100785840 申请日期 2010.05.24
申请人 BURNS DANIEL JAMES;FANTNER GEORG ERNEST;YOUCEF-TOUMI KAMAL;MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 BURNS DANIEL JAMES;FANTNER GEORG ERNEST;YOUCEF-TOUMI KAMAL
分类号 G01Q10/00 主分类号 G01Q10/00
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