An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.
申请公布号
US8062039(B2)
申请公布日期
2011.11.22
申请号
US20090398695
申请日期
2009.03.05
申请人
FARRIS JASON W.;HENRY DAVID W.;CAVEN JOSEPH J.;MARX DONALD A.;INTERCONNECT DEVICES, INC.
发明人
FARRIS JASON W.;HENRY DAVID W.;CAVEN JOSEPH J.;MARX DONALD A.
